User:Saoni: Difference between revisions

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* Saoni Banerji, Hanna Hõrak, Janno Torop, Tan-Phat Huynh (2024) [https://doi.org/10.1002/adsr.202300023 <nowiki>Unravelling the Secrets of Plants: Emerging Wearable Sensors for Plants Signals and Physiology</nowiki>], ''Advanced Sensor Research''. [https://doi.org/10.1002/adsr.202300023 https://doi.org/10.1002/adsr.202300023]
* Saoni Banerji, Hanna Hõrak, Janno Torop, Tan-Phat Huynh (2024) [https://doi.org/10.1002/adsr.202300023 <nowiki>Unravelling the Secrets of Plants: Emerging Wearable Sensors for Plants Signals and Physiology</nowiki>], ''Advanced Sensor Research''. [https://doi.org/10.1002/adsr.202300023 https://doi.org/10.1002/adsr.202300023]
* Oleksandr Syzoniuk, Saoni Banerji, Alvo Aabloo, Indrek Must (2024) [https://doi.org/10.3390/s24123937 <nowiki>Uncharged Monolithic Carbon Fibers Are More Sensitive to Cross-Junction Compression than Charged</nowiki>], ''Sensors''. [https://doi.org/10.3390/s24123937 https://doi.org/10.3390/s24123937]
* Oleksandr Syzoniuk, Saoni Banerji, Alvo Aabloo, Indrek Must (2024) [https://doi.org/10.3390/s24123937 <nowiki>Uncharged Monolithic Carbon Fibers Are More Sensitive to Cross-Junction Compression than Charged</nowiki>], ''Sensors''. [https://doi.org/10.3390/s24123937 https://doi.org/10.3390/s24123937]
* Marie Vihmar, Kadri-Ann Valdur, Saoni Banerji, Indrek Must (2023) [https://doi.org/10.1088/1757-899x/1292/1/012002 <nowiki>How to measure embodied intelligence?</nowiki>], ''IOP Conference Series: Materials Science and Engineering''. [https://doi.org/10.1088/1757-899x/1292/1/012002 https://doi.org/10.1088/1757-899x/1292/1/012002]
* Daniel Fernández, Piotr Michalik, JUAN JOSÉ VALLE FRAGA, Saoni Banerji, Josep Maria Sánchez-Chiva, Jordi Madrenas (2023) [https://doi.org/10.1109/jsen.2022.3224866 <nowiki>Monolithic Sensor Integration in CMOS Technologies</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2022.3224866 https://doi.org/10.1109/jsen.2022.3224866]
* Daniel Fernández, Piotr Michalik, JUAN JOSÉ VALLE FRAGA, Saoni Banerji, Josep Maria Sánchez-Chiva, Jordi Madrenas (2023) [https://doi.org/10.1109/jsen.2022.3224866 <nowiki>Monolithic Sensor Integration in CMOS Technologies</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2022.3224866 https://doi.org/10.1109/jsen.2022.3224866]
* Marie Vihmar, Kadri-Ann Valdur, Saoni Banerji, Indrek Must (2023) [https://doi.org/10.1088/1757-899x/1292/1/012002 <nowiki>How to measure embodied intelligence?</nowiki>], ''IOP Conference Series: Materials Science and Engineering''. [https://doi.org/10.1088/1757-899x/1292/1/012002 https://doi.org/10.1088/1757-899x/1292/1/012002]
* Dadras, I., Ghenna, S., Grondel, S., Cattan, E., Raik, J., Aabloo, A., Banerji, S. (2021) [http://doi.org/10.1109/JMEMS.2021.3060897 <nowiki>Modeling and Experimental Analysis of the Mass Loading Effect on Micro-Ionic Polymer Actuators Using Step Response Identification</nowiki>], ''Journal of Microelectromechanical Systems''. [http://doi.org/10.1109/JMEMS.2021.3060897 http://doi.org/10.1109/JMEMS.2021.3060897]
* Dadras, I., Ghenna, S., Grondel, S., Cattan, E., Raik, J., Aabloo, A., Banerji, S. (2021) [http://doi.org/10.1109/JMEMS.2021.3060897 <nowiki>Modeling and Experimental Analysis of the Mass Loading Effect on Micro-Ionic Polymer Actuators Using Step Response Identification</nowiki>], ''Journal of Microelectromechanical Systems''. [http://doi.org/10.1109/JMEMS.2021.3060897 http://doi.org/10.1109/JMEMS.2021.3060897]
* Mata-Hernandez, D., Fernández, D., Banerji, S., Madrenas, J. (2020) [http://doi.org/10.3390/s20216037 <nowiki>Resonant MEMS pressure sensor in 180 nm CMOS technology obtained by beol isotropic etching</nowiki>], ''Sensors (Switzerland)''. [http://doi.org/10.3390/s20216037 http://doi.org/10.3390/s20216037]
* Mata-Hernandez, D., Fernández, D., Banerji, S., Madrenas, J. (2020) [http://doi.org/10.3390/s20216037 <nowiki>Resonant MEMS pressure sensor in 180 nm CMOS technology obtained by beol isotropic etching</nowiki>], ''Sensors (Switzerland)''. [http://doi.org/10.3390/s20216037 http://doi.org/10.3390/s20216037]
* Saoni Banerji, Daniel Fernandez, Jordi Madrenas (2018) [https://doi.org/10.1109/jsen.2018.2797526 <nowiki>A Comprehensive High-Level Model for CMOS-MEMS Resonators</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2018.2797526 https://doi.org/10.1109/jsen.2018.2797526]
* Saoni Banerji, Daniel Fernandez, Jordi Madrenas (2018) [https://doi.org/10.1109/jsen.2018.2797526 <nowiki>A Comprehensive High-Level Model for CMOS-MEMS Resonators</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2018.2797526 https://doi.org/10.1109/jsen.2018.2797526]
* Saoni Banerji, Daniel Fernandez, Jordi Madrenas (2017) [https://doi.org/10.1109/jsen.2017.2747140 <nowiki>Characterization of CMOS-MEMS Resonant Pressure Sensors</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2017.2747140 https://doi.org/10.1109/jsen.2017.2747140]
* Saoni Banerji, Piotr Michalik, Daniel Fernández, Jordi Madrenas, Albert Mola, Josep Montanyà (2017) [https://doi.org/10.1007/s00542-016-2878-3 <nowiki>CMOS-MEMS resonant pressure sensors: optimization and validation through comparative analysis</nowiki>], ''Microsystem Technologies''. [https://doi.org/10.1007/s00542-016-2878-3 https://doi.org/10.1007/s00542-016-2878-3]
* Saoni Banerji, Piotr Michalik, Daniel Fernández, Jordi Madrenas, Albert Mola, Josep Montanyà (2017) [https://doi.org/10.1007/s00542-016-2878-3 <nowiki>CMOS-MEMS resonant pressure sensors: optimization and validation through comparative analysis</nowiki>], ''Microsystem Technologies''. [https://doi.org/10.1007/s00542-016-2878-3 https://doi.org/10.1007/s00542-016-2878-3]
* Saoni Banerji, Daniel Fernandez, Jordi Madrenas (2017) [https://doi.org/10.1109/jsen.2017.2747140 <nowiki>Characterization of CMOS-MEMS Resonant Pressure Sensors</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2017.2747140 https://doi.org/10.1109/jsen.2017.2747140]
* Saoni Banerji, R.Senthil Kumar (2010) Diagnosis of Systems Via Wavelet Transform Analysis based on Time Frequency Representations , ''Int. J. of Recent Trends in Engineering and Technology''.
* Saoni Banerji, R.Senthil Kumar (2010) Diagnosis of Systems Via Wavelet Transform Analysis based on Time Frequency Representations , ''Int. J. of Recent Trends in Engineering and Technology''.



Revision as of 04:01, 14 November 2024

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