Electric and magnetic field analyses in ALT tester

From Intelligent Materials and Systems Lab

Accelerated Lifetime Tester (ALT) in ABB.

Purpose of the thesis

ALT- Accelerated Lifetime tester

Simulate/measure electric and magnetic fields in ALT tester to see how the equimpment in the tester is influencing eachother and to be confident that there are no disturbances in the tester

The disturbances in the tester can cause:

  • Loss of data
  • False failures of products under test
  • Test system failures

Trigger for the thesis

  • We need to be confident that the tester is robust and reliable to operate in the manner we are expecting it to be. Even though the equimpment we are using in the tester is EMC compliant we have had some failures in the system what we have thought that have happenened due to EMC issues.

Thesis should include

  • Simulation results
  • Measurement results
  • Improvement proposals

File:Electric and magnetic field analyses in ALT tester.pdf