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* Diana Mata-Hernandez, Daniel Fernández, Saoni Banerji, Jordi Madrenas (2020) [https://doi.org/10.3390/s20216037 <nowiki>Resonant MEMS Pressure Sensor in 180 nm CMOS Technology Obtained by BEOL Isotropic Etching</nowiki>], ''Sensors''. [https://doi.org/10.3390/s20216037 https://doi.org/10.3390/s20216037]
* Diana Mata-Hernandez, Daniel Fernández, Saoni Banerji, Jordi Madrenas (2020) [https://doi.org/10.3390/s20216037 <nowiki>Resonant MEMS Pressure Sensor in 180 nm CMOS Technology Obtained by BEOL Isotropic Etching</nowiki>], ''Sensors''. [https://doi.org/10.3390/s20216037 https://doi.org/10.3390/s20216037]
* Saoni Banerji, Daniel Fernandez, Jordi Madrenas (2018) [https://doi.org/10.1109/jsen.2018.2797526 <nowiki>A Comprehensive High-Level Model for CMOS-MEMS Resonators</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2018.2797526 https://doi.org/10.1109/jsen.2018.2797526]
* Saoni Banerji, Daniel Fernandez, Jordi Madrenas (2018) [https://doi.org/10.1109/jsen.2018.2797526 <nowiki>A Comprehensive High-Level Model for CMOS-MEMS Resonators</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2018.2797526 https://doi.org/10.1109/jsen.2018.2797526]
* Saoni Banerji, Daniel Fernandez, Jordi Madrenas (2017) [https://doi.org/10.1109/jsen.2017.2747140 <nowiki>Characterization of CMOS-MEMS Resonant Pressure Sensors</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2017.2747140 https://doi.org/10.1109/jsen.2017.2747140]
* Saoni Banerji, Piotr Michalik, Daniel Fernández, Jordi Madrenas, Albert Mola, Josep Montanyà (2017) [https://doi.org/10.1007/s00542-016-2878-3 <nowiki>CMOS-MEMS resonant pressure sensors: optimization and validation through comparative analysis</nowiki>], ''Microsystem Technologies''. [https://doi.org/10.1007/s00542-016-2878-3 https://doi.org/10.1007/s00542-016-2878-3]
* Saoni Banerji, Piotr Michalik, Daniel Fernández, Jordi Madrenas, Albert Mola, Josep Montanyà (2017) [https://doi.org/10.1007/s00542-016-2878-3 <nowiki>CMOS-MEMS resonant pressure sensors: optimization and validation through comparative analysis</nowiki>], ''Microsystem Technologies''. [https://doi.org/10.1007/s00542-016-2878-3 https://doi.org/10.1007/s00542-016-2878-3]
* Saoni Banerji, Daniel Fernandez, Jordi Madrenas (2017) [https://doi.org/10.1109/jsen.2017.2747140 <nowiki>Characterization of CMOS-MEMS Resonant Pressure Sensors</nowiki>], ''IEEE Sensors Journal''. [https://doi.org/10.1109/jsen.2017.2747140 https://doi.org/10.1109/jsen.2017.2747140]
* Saoni Banerji, R.Senthil Kumar (2010) Diagnosis of Systems Via Wavelet Transform Analysis based on Time Frequency Representations , ''Int. J. of Recent Trends in Engineering and Technology''.
* Saoni Banerji, R.Senthil Kumar (2010) Diagnosis of Systems Via Wavelet Transform Analysis based on Time Frequency Representations , ''Int. J. of Recent Trends in Engineering and Technology''.



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