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	<id>https://ims.ut.ee/index.php?action=history&amp;feed=atom&amp;title=Electric_and_magnetic_field_analyses_in_ALT_tester</id>
	<title>Electric and magnetic field analyses in ALT tester - Revision history</title>
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	<updated>2026-04-25T14:43:46Z</updated>
	<subtitle>Revision history for this page on the wiki</subtitle>
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	<entry>
		<id>https://ims.ut.ee/index.php?title=Electric_and_magnetic_field_analyses_in_ALT_tester&amp;diff=18422&amp;oldid=prev</id>
		<title>Vahur: Created page with &quot;Accelerated Lifetime Tester (ALT) in ABB.  '''Purpose of the thesis'''  ALT- Accelerated Lifetime tester  Simulate/measure electric and...&quot;</title>
		<link rel="alternate" type="text/html" href="https://ims.ut.ee/index.php?title=Electric_and_magnetic_field_analyses_in_ALT_tester&amp;diff=18422&amp;oldid=prev"/>
		<updated>2018-07-30T07:49:01Z</updated>

		<summary type="html">&lt;p&gt;Created page with &amp;quot;&lt;a href=&quot;/File:ALT_tester.png&quot; title=&quot;File:ALT tester.png&quot;&gt;frameless|right|Accelerated Lifetime Tester (ALT) in ABB.&lt;/a&gt;  &amp;#039;&amp;#039;&amp;#039;Purpose of the thesis&amp;#039;&amp;#039;&amp;#039;  ALT- Accelerated Lifetime tester  Simulate/measure electric and...&amp;quot;&lt;/p&gt;
&lt;p&gt;&lt;b&gt;New page&lt;/b&gt;&lt;/p&gt;&lt;div&gt;[[File:ALT tester.png|frameless|right|Accelerated Lifetime Tester (ALT) in ABB.]]&lt;br /&gt;
&lt;br /&gt;
'''Purpose of the thesis'''&lt;br /&gt;
&lt;br /&gt;
ALT- Accelerated Lifetime tester&lt;br /&gt;
&lt;br /&gt;
Simulate/measure electric and magnetic fields in ALT tester to see how the equimpment in the tester is influencing eachother and to be confident that there are no disturbances in the tester&lt;br /&gt;
&lt;br /&gt;
'''The disturbances in the tester can cause:'''&lt;br /&gt;
&lt;br /&gt;
*Loss of data&lt;br /&gt;
*False failures of products under test&lt;br /&gt;
*Test system failures&lt;br /&gt;
&lt;br /&gt;
'''Trigger for the thesis'''&lt;br /&gt;
&lt;br /&gt;
*We need to be confident that the tester is robust and reliable to operate in the manner we are expecting it to be. Even though the equimpment we are using in the tester is EMC compliant we have had some failures in the system what we have thought that have happenened due  to EMC issues.&lt;br /&gt;
&lt;br /&gt;
'''Thesis should include'''&lt;br /&gt;
&lt;br /&gt;
*Simulation results&lt;br /&gt;
*Measurement results &lt;br /&gt;
*Improvement proposals&lt;br /&gt;
&lt;br /&gt;
[[File:Electric and magnetic field analyses in ALT tester.pdf|thumb]]&lt;/div&gt;</summary>
		<author><name>Vahur</name></author>
	</entry>
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